Abstract
Stacking-fault tetrahedra are observed in the defect structure of newly recrystallized grains of silver and several low stacking-fault energy alloys. Analyses of partially formed stacking-fault tetrahedra and intrinsic fault bends suggest that the tetrahedra arise from the annealing of intersecting faults in the newly recrystallized grains by a mechanism involving the formation of truncated tetrahedra from the earliest stage.