Measuring the backscattering coefficient and secondary electron yield inside a scanning electron microscope
- 1 January 1980
- Vol. 3 (1), 35-39
- https://doi.org/10.1002/sca.4950030105
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Secondary electron emission in the scanning electron microscopeScanning, 1978
- Physical background of electron backscatteringScanning, 1978
- A Simple Method for Making Fine Mesh Hemispherical GridsReview of Scientific Instruments, 1972
- Backscattered and Secondary Electron Emission as Ancillary Techniques in Electron Probe AnalysisPublished by Elsevier ,1969
- Quantitative Microprobe Analysis by Means of Target Current Measurements*Advances in X-ray Analysis, 1966
- Interrelationships of Sample Composition, Backscatter Coefficient, and Target Current MeasurementAdvances in X-ray Analysis, 1963