Real-space interpretation of x-ray-excited Auger-electron diffraction from Cu(001)
- 15 March 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 37 (8), 3959-3963
- https://doi.org/10.1103/physrevb.37.3959
Abstract
Angle-resolved Auger-electron diffraction from single-crystal Cu(001) surfaces is reported covering the complete range of emission solid angle between inequivalent mirror planes. Contour maps of the Auger-electron polar and azimuthal angular distribution clearly show the relationship of the measured intensity to low-index real-space crystallographic axes. An experimental approach is described which provides a means for surface-sensitive structure determinations in x-ray-excited electron spectroscopy by comparison to the direct lattice using geometrical constructions.Keywords
This publication has 18 references indexed in Scilit:
- Role of multiple scattering in x-ray photoelectron spectroscopy and Auger-electron diffraction in crystalsPhysical Review Letters, 1987
- X-ray photoelectron diffraction at high angular resolutionPhysical Review B, 1987
- Growth of metastable fcc Co on Ni(001)Physical Review B, 1987
- High-temperature nucleation and silicide formation at the Co/Si(111)-7×7 interface: A structural investigationPhysical Review B, 1986
- Direct observation of elastic strain and relaxation at a metal-metal interface by Auger electron diffraction: Cu/Ni(001)Physical Review B, 1986
- Structural characterization of metal-metal interfaces by intermediate-energy Auger-electron diffractionPhysical Review B, 1985
- Atomic structure of the Cu/Si(111) interface by high-energy core-level Auger electron diffractionPhysical Review B, 1985
- Methoxylation of magnesium studied by direct recoil spectroscopy, SIMS and XPS: Calibration of relative surface hydrogen concentrationSurface Science Letters, 1985
- Determination of epitaxial overlayer structures from high-energy electron scattering and diffractionPhysical Review B, 1985
- Quantitative analysis of a submonolayer adsorption system by angle resolved XPS: c(2×2)S on Ni(001)Journal of Vacuum Science & Technology A, 1984