Line shape measurements of atoms sputtered from polycrystalline Cu, Zn, and Al by 300 keV Ar+ bombardment
- 1 February 1976
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 132, 439-444
- https://doi.org/10.1016/0029-554x(76)90772-2
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- Effects of nonradiative de-excitation of excited sputtered atoms near silicon and silicon dioxide surfacesSurface Science, 1975
- Bombardment-induced photon emission from Al and Al2O3 targetsSurface Science, 1974
- Photon emission from low-energy ion and neutral bombardment of solidsRadiation Effects, 1973
- Surface Composition Determined by Analysis of Impact RadiationScience, 1972
- Photon emission during bombardment of solids with alkali ions in the energy range between 2 and 10 keVPhysica Status Solidi (a), 1972
- Photon emission from sputtered particles during ion bombardmentPhysica Status Solidi (a), 1971
- Dispositif de filtrage optique a haute r solution utilisable en microscopie spectraleNouvelle Revue d'Optique Appliquée, 1971
- Excitation of Cu atoms by Ar ions and subsequent radiationless deexcitation of scattered particles near a Cu surfacePhysica, 1969
- Messung von Lumineszenzabklingzeiten anorganischer Leuchtstoffe bei Anregung mit IonenThe European Physical Journal A, 1959
- Theory of Auger Ejection of Electrons from Metals by IonsPhysical Review B, 1954