Femtogram mass detection using photothermally actuated nanomechanical resonators
Top Cited Papers
- 21 April 2003
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 82 (16), 2697-2699
- https://doi.org/10.1063/1.1569050
Abstract
Nanomechanical devices with very small mass and size have the potential for mass sensing at the level of individual molecules. In the present study, we designed nanomechanical mass sensors, demonstrated their operation under ambient pressure and temperature, and achieved femtogram-level mass sensitivity. Our nanomechanical resonators were gold-coated silicon cantilevers with resonance frequencies in the range of 1 to 10 MHz, characteristic thicknesses of 50–100 nm, and force constants of about 0.1 N/m. Using a cantilever with a resonant frequency of 2.2 MHz that was excited photothermally, we measured a mass change of 5.5 fg upon chemisorption of 11-mercaptoundecanoic acid. Our analysis indicates that, by decreasing the mass of the cantilever and increasing the excitation amplitude, even higher mass sensitivity can be realized in an easily accessible frequency range (<100 MHz).Keywords
This publication has 20 references indexed in Scilit:
- Peer Reviewed: Microcantilever Transducers: A new Approach in Sensor TechnologyPublished by American Chemical Society (ACS) ,2002
- Towards atomic force microscopy up to 100 MHzReview of Scientific Instruments, 2002
- Millions of cantilevers for atomic force microscopyReview of Scientific Instruments, 2002
- Single cell detection with micromechanical oscillatorsJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2001
- Enhanced chemi-mechanical transduction at nanostructured interfacesChemical Physics Letters, 2001
- Detection of 2-mercaptoethanol using gold-coated micromachined cantileversSensors and Actuators B: Chemical, 1999
- MICROCANTILEVER SENSORSMicroscale Thermophysical Engineering, 1997
- Acoustic Chemical SensorsScience, 1991
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991