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Perfectly Conformal TiN and Al2O3 Films Deposited by Atomic Layer Deposition
Home
Publications
Perfectly Conformal TiN and Al2O3 Films Deposited by Atomic Layer Deposition
Perfectly Conformal TiN and Al2O3 Films Deposited by Atomic Layer Deposition
Mikko Ritala
Mikko Ritala
Markku Leskelä
Markku Leskelä
JD
Jan-Pieter Dekker
Jan-Pieter Dekker
CM
Cees Mutsaers
Cees Mutsaers
PS
Pekka J. Soininen
Pekka J. Soininen
JS
Jarmo Skarp
Jarmo Skarp
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1 January 1999
journal article
research article
Published by
Wiley
in
Chemical Vapor Deposition
Vol. 5
(1)
,
7-9
https://doi.org/10.1002/(sici)1521-3862(199901)5:1<7::aid-cvde7>3.0.co;2-j
Abstract
No abstract available
Keywords
CVD
FIGURE
CONFORMAL
GOOD
ATOMIC
SEE
TRENCHES
GIVE
PERFECTLY
Cited by 259 articles