Reduction of Leed data for surface crystallography
- 15 June 1972
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 10 (12), 1199-1203
- https://doi.org/10.1016/0038-1098(72)90943-x
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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- Low-Energy-Electron Diffraction from Al(100), Al(110), Al(111), and Cu(100)Physical Review B, 1971
- Dynamical calculations of LEED intensities at clean copper (001) surfaceSurface Science, 1971
- Calculation of phase shifts by Calogero's method; application to aluminumSolid State Communications, 1971
- Kinematic Low-Energy Electron-Diffraction Intensities from Averaged Data: A Method for Surface CrystallographyPhysical Review Letters, 1971
- Accurate Calculation of the Low-Energy Electron-Diffraction Spectra of Al by the Layer—Korringa-Kohn-Rostoker MethodPhysical Review Letters, 1971
- Interpretation of Low-Energy Electron-Diffraction Spectra for a Free-Electron Metal in Terms of Multiple Scattering Involving Strong Inelastic DampingPhysical Review Letters, 1971
- Calculated Low-Energy Electron-Diffraction Intensities for the (001) Surface of A1Physical Review Letters, 1970
- Multiple diffraction origin of low energy electron diffraction intensities. IIActa Crystallographica Section A, 1969