Measurement and analysis of charge injection in MOS analog switches
- 1 April 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 22 (2), 277-281
- https://doi.org/10.1109/jssc.1987.1052713
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Measurement and modeling of charge feedthrough in n-channel MOS analog switchesIEEE Journal of Solid-State Circuits, 1985
- Measurement of minimum-geometry MOS transistor capacitancesIEEE Transactions on Electron Devices, 1985
- Switch-induced error voltage on a switched capacitorIEEE Journal of Solid-State Circuits, 1984
- Residual charge on a switched capacitor [MOS type]IEEE Journal of Solid-State Circuits, 1983
- A MOS switched-capacitor instrumentation amplifierIEEE Journal of Solid-State Circuits, 1982
- Microwatt Switched Capacitor Circuit DesignActive and Passive Electronic Components, 1981
- All-MOS charge-redistribution analog-to-digital conversion techniques. IIIEEE Journal of Solid-State Circuits, 1975