Abstract
A weak magnetic contrast usually appears in domain images obtained at normal incidence in the reflective mode of scanning electron microscopy. Moreover, an unusual bright or dark line appears at each domain wall, regardless of whether the specimen is tilted or not. The dependence of the wall image width on accelerating voltage and detection direction suggests that the width is related to the diffusion area of primary electrons inside the material which are emitted as back-scattered electrons at a specified take-off angle.