The effect of thickness on the distribution of dislocations in cold-rolled aluminium
- 1 December 1964
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 10 (108), 937-948
- https://doi.org/10.1080/14786436408225402
Abstract
The ratio of the electrical resistivity at 293°k and 77°k has been measured as a function of thickness in the range 13 μ to 2 μ for annealed and cold-rolled super-purity aluminium. The annealed specimens show the dependence predicted by Fuchs' theory of surface scattering. The cold-rolled specimens show a deviation from Fuchs' theory which may be attributed to a loss of dislocations during thinning. The loss is estimated to be about 80%.Keywords
This publication has 10 references indexed in Scilit:
- Dislocation rearrangement in fatigue-hardened aluminium during preparation for transmission electron microscopyPhilosophical Magazine, 1964
- The electrical resistivity of dislocationsPhilosophical Magazine, 1963
- Electrical Size Effect in AluminumJournal of Applied Physics, 1963
- On the loss of dislocations during the preparation of a thin filmPhilosophical Magazine, 1962
- Nuclear magnetic resonance, stored energy, and the density of dislocations in deformed aluminiumPhilosophical Magazine, 1962
- The dislocation distribution, flow stress, and stored energy in cold-worked polycrystalline silverPhilosophical Magazine, 1960
- Lattice defects and the electrical resistivity of metalsAdvances in Physics, 1954
- The mean free path of electrons in metalsAdvances in Physics, 1952
- The Effect of Cold Working on the Electrical Resistivity of Copper and AluminumPhysical Review B, 1950
- The conductivity of thin metallic films according to the electron theory of metalsMathematical Proceedings of the Cambridge Philosophical Society, 1938