Multi-bit storage through Si nanocrystals embedded in SiO2
- 30 April 2004
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 72 (1-4), 411-414
- https://doi.org/10.1016/j.mee.2004.01.023
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Electrons retention model for localized charge in oxide-nitride-oxide (ONO) dielectricIEEE Electron Device Letters, 2002
- NROM: A novel localized trapping, 2-bit nonvolatile memory cellIEEE Electron Device Letters, 2000