SIMIPS: secondary ion mass image processing system
- 1 May 1987
- journal article
- research article
- Published by American Chemical Society (ACS) in Journal of Chemical Information and Computer Sciences
- Vol. 27 (2), 86-94
- https://doi.org/10.1021/ci00054a009
Abstract
Note: In lieu of an abstract, this is the article's first page.This publication has 4 references indexed in Scilit:
- Evaluation of ion microscopic spatial resolution and image qualityAnalytical Chemistry, 1986
- Ion implantation for quantitative ion microscopy of biological soft tissueAnalytical Chemistry, 1983
- Differential sputtering correction for ion microscopy with image depth profilingAnalytical Chemistry, 1982
- Thresholding Using the ISODATA Clustering AlgorithmIEEE Transactions on Systems, Man, and Cybernetics, 1980