SFM characterization of SrBi2Ta2O9 thin films for nanoscale memory applications
- 1 November 1999
- journal article
- research article
- Published by Taylor & Francis in Integrated Ferroelectrics
- Vol. 27 (1-4), 159-169
- https://doi.org/10.1080/10584589908228465
Abstract
Scanning force microscopy (SFM) has been used for comparative studies of domain structures in SrBi2Ta2O9 (SBT) thin films grown by sol-gel, Flash MOCVD and pulsed laser deposition (PLD) techniques. Investigation has been focused on establishing microscopic correlation between crystallinity, domain arrangements and switching behavior of the films. It has been shown that the domain contrast of an individual grain and its switchability are strongly dependent on the grain orientation. The remnant polarization value was found to decrease with decrease in the fraction of a-oriented grains which exhibit sharp domain contrast.Keywords
This publication has 12 references indexed in Scilit:
- Epitaxial and large area PLD ferroelectric thin film heterostructures on silicon substratesIntegrated Ferroelectrics, 1998
- IMAGING AND CONTROL OF DOMAIN STRUCTURES IN FERROELECTRIC THIN FILMS VIA SCANNING FORCE MICROSCOPYAnnual Review of Materials Science, 1998
- Scanning force microscopy: Application to nanoscale studies of ferroelectric domainsIntegrated Ferroelectrics, 1998
- Control and imaging of ferroelectric domains over large areas with nanometer resolution in atomically smooth epitaxial Pb(Zr0.2Ti0.8)O3 thin filmsApplied Physics Letters, 1998
- Characteristics of PZT thin films as ultra-high density recording mediaIntegrated Ferroelectrics, 1997
- Characteristics of ferroelectric SrBi2Ta2O9 thin films grown by “flash” MOCVDIntegrated Ferroelectrics, 1997
- Structural and ferroelectric properties of the c-axis oriented SrBi2Ta2O9 thin films deposited by the radio-frequency magnetron sputteringApplied Physics Letters, 1996
- Oriented growth of SrBi2Ta2O9 ferroelectric thin filmsApplied Physics Letters, 1996
- Fatigue-free ferroelectric capacitors with platinum electrodesNature, 1995
- Preparation and ferroelectric properties of SrBi2Ta2O9 thin filmsApplied Physics Letters, 1995