High-Energy Light Emission from Junctions in GaAsxP1−x Diodes

Abstract
Spontaneous and stimulated emission from junctions in diodes made of silicon‐doped, melt‐grown GaAsxP1−x alloys have been studied. Variations of the emission spectra as a function of current and of composition ranging up to 40 mole % GaP were examined both at room temperature and 77°K.

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