Quantized resistance in in-plane gated narrow constriction fabricated by wet etching

Abstract
A narrow in-plane gated constriction is defined by technique employing electron beam lithography and wet chemical etching. Two-dimensional electron gas beside the narrow channel is used to control the number of occupied subbands in the constriction. A ballistic transport through the point contact is manifested by the observation of successive resistance steps when the subbands are depopulated.