How to extract information about domain kinetics in thin ferroelectric films from switching transient current data
- 1 December 1994
- journal article
- research article
- Published by Taylor & Francis in Integrated Ferroelectrics
- Vol. 5 (4), 293-301
- https://doi.org/10.1080/10584589408223886
Abstract
The paper presents the new method of mathematical treatment which allows to extract essential information about domain kinetics in polycrystal films from the traditional measurements of switching current. This information can not be obtained within the commonly used treatment. The method was verified by computer simulation and direct experiments in model single crystals.Keywords
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