Spectroscopy of surface charge layers on p-type Si
- 1 August 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 58 (1), 135-137
- https://doi.org/10.1016/0039-6028(76)90122-9
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Density-functional calculation of sub-band structure in accumulation and inversion layersPhysical Review B, 1976
- Effect of the Electron-Electron Interaction on the Excitation Energies of an-Inversion Layer on SiPhysical Review Letters, 1975
- Resonance Spectroscopy of Electronic Levels in a Surface Accumulation LayerPhysical Review Letters, 1974
- Self-Consistent Results for-Type Si Inversion LayersPhysical Review B, 1972