Decohesion of Thin Films From Ceramic Substrates
- 1 January 1985
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Measurement of adherence of residually stressed thin films by indentation. I. Mechanics of interface delaminationJournal of Applied Physics, 1984
- On the mechanics of delamination and spalling in compressed filmsInternational Journal of Solids and Structures, 1984
- Plane Problems of Cracks in Dissimilar MediaJournal of Applied Mechanics, 1965