Adjustment of a STEM instrument by use of shadow images
- 31 December 1979
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 4 (4), 413-418
- https://doi.org/10.1016/s0304-3991(79)80018-2
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Innovative imaging and microdiffraction in stemUltramicroscopy, 1978
- Selected-Area Diffraction in the Shadow Electron MicroscopeZeitschrift für Naturforschung A, 1976