Calculations of the Intensity of X-Ray Diffuse Scattering Produced by Point Defects in Cubic Metals
- 15 March 1970
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 1 (6), 2472-2483
- https://doi.org/10.1103/physrevb.1.2472
Abstract
We have calculated isointensity profiles for the diffuse x-ray scattering associated with certain types of defects in Cu, Al, Na, K, Li, and a theoretical model lattice. These profiles were computed for high-symmetry planes very close to reciprocal-lattice points of the (), (), and () type. Both cubic and double-force defects were treated. The calculations were done using a technique presented by Kanzaki for the theoretical model lattice. Kanzaki's general conclusion that cubic defects produce leminiscate profiles and that double-force defects produce ellipsoidal profiles is confirmed for all the material studied. Our profiles for the model lattice agree with those obtained by Kanzaki, except for the profiles due to a double-force defect near an () reciprocal-lattice point.
Keywords
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