Random uncertainties in AES and XPS: II: Quantification using either relative or absolute measurements
- 1 May 1992
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 18 (5), 361-367
- https://doi.org/10.1002/sia.740180509
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The determination of uncertainties in quantitative XPS/AES and its impact on data acquisition strategySurface and Interface Analysis, 1992
- Random uncertainties in AES and XPS: I: Uncertainties in peak energies, intensities and areas derived from peak synthesisSurface and Interface Analysis, 1992
- Scatter diagrams and hotelling transforms: application to surface analytical microscopyJournal of Electron Spectroscopy and Related Phenomena, 1990
- Precision, accuracy, and uncertainty in quantitative surface analyses by Auger-electron spectroscopy and x-ray photoelectron spectroscopyJournal of Vacuum Science & Technology A, 1990