Abstract
Several formulae have been derived expressing the contribution to the intensity of electron scattering of restricted rotation in the vapors of ethane, ethylene, biphenyl, and their derivatives. The probability distribution of the restricted rotator about its axis of rotation is expressed in terms of the barrier height, V0. It has, therefore, been possible to evaluate the effect of barriers of known magnitude on scattering patterns. The possibility of evaluating the potential barrier using electron diffraction is discussed.