Fault-tolerant design of local ESS processors
- 1 January 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
- Vol. 66 (10), 1126-1145
- https://doi.org/10.1109/proc.1978.11108
Abstract
The stored program control of Bell System Electronic Switching Systems (ESS) has been under development since 1953. During this period, the No. 1 ESS, the No. 2 ESS, and the No. 3 ESS have been developed and used extensively by Bell System operating companies to provide commercial telephone service. These systems serve all types of telephone offices: The large-capacity No. 1 ESS serves metropolitan offices, the medium-capacity No. 2 ESS was designed for suburban offices, and the No. 3 ESS can be found in many small rural offices. The fault tolerant design of ESS processors provides the same highly dependable telephone service established by the previous electro-mechanical systems. Pertinent processor architecture features used to achieve ESS reliablity objectives are discussed. A detailed discussion of the maintenance design of the 3A Processor is also included.Keywords
This publication has 23 references indexed in Scilit:
- 1A Processor: Maintenance SoftwareBell System Technical Journal, 1977
- System/360 model 85 microdiagnosticsPublished by Association for Computing Machinery (ACM) ,1970
- System Organization and ObjectivesBell System Technical Journal, 1969
- Service Features and Call Processing PlanBell System Technical Journal, 1969
- No. 1 ESS Program StoreBell System Technical Journal, 1964
- No. 1 ESS Call Store - A 0.2-Megabit Ferrite Sheet MemoryBell System Technical Journal, 1964
- No. 1 ESS Logic Circuits and Their Application to the Design of the Central ControlBell System Technical Journal, 1964
- No. 1 ESS: System Organization and ObjectivesBell System Technical Journal, 1964
- Common control for an electronic private branch exchangeIEEE Transactions on Communication and Electronics, 1964
- A Programming System for Detection and Diagnosis of Machine MalfunctionsIEEE Transactions on Electronic Computers, 1963