Ion-Bombardment Etching of Synthetic Fibers

Abstract
An ion‐bombardment etching method was used to prepare synthetic fiber samples for study in the electron microscope. Reproductible results were obtained by bombardment in a constantly changing argon atmosphere at a pressure of 1–2 cm Hg for 2–5 min. The etch patterns produced by this method were characteristic of the orientation of the fiber samples which were investigated.