Oscillation photography of radiation-sensitive crystals using a synchrotron source

Abstract

A method is described to determine the accurate setting of a crystal placed in an unknown orientation on an oscillation camera. This avoids time-consuming setting operations during which the crystal is subject to continuous radiation damage initiated by the first setting photograph. It also ensures maximal use of synchrotron radiation time as there is no need for any prior setting and developing periods. The method is dependent on measuring the lengths and orientations of the major axes of the ellipses on two, preferably approximately orthogonal, `still' photographs.