Microscopic and spectroscopic characterization of interfaces and dielectric layers for OFET devices
- 6 March 2008
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 205 (3), 600-611
- https://doi.org/10.1002/pssa.200723424
Abstract
No abstract availableKeywords
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