X-ray diffuse scattering as a probe for thin film and interface structure
- 1 September 1994
- journal article
- Published by EDP Sciences in Journal de Physique III
- Vol. 4 (9), 1543-1557
- https://doi.org/10.1051/jp3:1994221
Abstract
Journal de Physique III, Journal de Physique Archives représente une mine d informations facile à consulter sur la manière dont la physique a été publiée depuis 1872.Keywords
This publication has 21 references indexed in Scilit:
- Interfacial roughness of sputtered multilayers: Nb/SiPhysical Review B, 1993
- Effect of the form of the height-height correlation function on diffuse x-ray scattering from a self-affine surfacePhysical Review B, 1993
- X-ray reflection from rough layered systemsPhysical Review B, 1993
- Nonspecular x-ray scattering from the amorphous state in W/C multilayersApplied Physics Letters, 1992
- Neutron scattering by rough surfaces at grazing incidencePhysical Review B, 1992
- X-ray-scattering study of capillary-wave fluctuations at a liquid surfacePhysical Review Letters, 1991
- X-ray and neutron scattering from rough surfacesPhysical Review B, 1988
- Shape of Crystals at Low Temperatures: Absence of Quantum RougheningPhysical Review Letters, 1983
- Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicatesRevue de Physique Appliquée, 1980
- Anomalous Surface Reflection of X RaysPhysical Review B, 1963