The microscopic examination of the structure of sub-surface horizons of soils

Abstract

What is meant by “soil structure”? Microscopic examination of thin sections of soil, using such instruments as the polarising microscope, X-ray diffractometer and scanning electron microscope has enabled a classification of the components of soils and their structural types to be built up. Now with the aid of the image-analysing computer these components can be quantified rapidly, characteristics may be calculated and their behaviour under varying cultural conditions predicted.