Loop Shaped Images Observed in X-Ray Diffraction Micrographs of Silicon Single Crystals
- 1 March 1962
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 17 (3), 583-584
- https://doi.org/10.1143/jpsj.17.583
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Studies of Individual Dislocations in Crystals by X-Ray Diffraction MicroradiographyJournal of Applied Physics, 1959
- X-ray Observations of the Surfaces of Plastically Deformed LiF Crystals with the Berg-Barret MethodJournal of the Physics Society Japan, 1959
- Dislocation loops in quenched aluminiumPhilosophical Magazine, 1958