Effect of Electron Traps on Residual Voltage in Chalcogenide Photoreceptors

Abstract

The effect of electron traps on the residual voltage in chalcogenide photoreceptors is discussed. In order to cancel hole traps in these photoreceptors and to decrease the residual voltage, it is useful to introduce electron traps. It is seen from numerical calculation that, in the case of uniform distribution of the normalized electron trap density N _tn, the introduction of N _tn=1.0 decreases the the residual voltage to one tenth of N _tn=0. On the other hand, in the case of exponential distribution of the normalized electron trap N _tn(x)=N ₀exp (-A x), it is interesting that the residual voltage V _r is greatly influenced by the electron trap density at the interface of the substrate.