Precise Temperature Measurement in Debye-Scherrer Specimens at Elevated Temperatures
- 1 April 1965
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 48 (4), 202-205
- https://doi.org/10.1111/j.1151-2916.1965.tb14712.x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A STUDY OF TEMPERATURE MEASUREMENT PRECISION IN DEBYE-SCHERRER SPECIMENS DURING HIGH TEMPERATURE X-RAY DIFFRACTION MEASUREMENT OF THERMAL EXPANSIONPublished by Office of Scientific and Technical Information (OSTI) ,1962
- A mathematical technique for the precision determination of lattice parametersActa Crystallographica, 1961
- X-RAY CRYSTALLOGRAPHIC INTENSITY FUNCTIONSPublished by Office of Scientific and Technical Information (OSTI) ,1959