Interaction of Pd-overlayers with SnO2: comparative XPS, SIMS, and SNMS studies
- 1 January 1991
- journal article
- research article
- Published by Springer Nature in Analytical and Bioanalytical Chemistry
- Vol. 341 (1-2), 25-30
- https://doi.org/10.1007/bf00322101
Abstract
No abstract availableKeywords
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- Recent applications of secondary neutral mass spectrometry for quantitative analysis of homogeneous and structured samplesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- Quantitative chemical surface, in-depth, and bulk analysis by secondary neutrals mass spectrometry (SNMS)Journal of Vacuum Science & Technology A, 1985
- Transparent conductors—A status reviewThin Solid Films, 1983