Effect of Au nucleation centers and deposition rate on crystallinity and electronic properties of evaporated Te films.
- 1 January 1975
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 46 (1), 105-111
- https://doi.org/10.1063/1.322247
Abstract
The effect of Au nucleation sites, deposition rates, and the film thickness on the crystallinity and electronic properties of evaporated Te films has been investigated. It has been found that to obtain large−grain Te films there exists an optimum conditoin in the coating ratio of Au nucleation sites and the film thickness of Te, and that a fast deposition rate of Te results generally in large−grain Te films with preferred orientation. The best films obtained have shown a grain size of 20−30 μ diameter with the c axis parallel to the substrate and a Hall mobility of 170 cm2 V−1 sec−1.Keywords
This publication has 4 references indexed in Scilit:
- Hall Mobility of Evaporated Tellurium FilmsJapanese Journal of Applied Physics, 1973
- Large grain tellurium thin filmsThin Solid Films, 1972
- Electrical properties of tellurium thin filmsProceedings of the IEEE, 1971
- Structure and growth of oriented tellurium thin filmsThin Solid Films, 1971