Measurements of Transfer Inefficiency of 250-Element Undercut-Isolated Charge Coupled Devices
- 1 January 1973
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 52 (1), 1-7
- https://doi.org/10.1002/j.1538-7305.1973.tb03180.x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Charge Transfer DevicesJournal of Vacuum Science and Technology, 1972
- Two-Phase Stepped Oxide CCD Shift Register Using Undercut IsolationApplied Physics Letters, 1972
- Implanted-Barrier Two-Phase Charge-Coupled DeviceApplied Physics Letters, 1971
- Charge-coupled digital circuitsIEEE Journal of Solid-State Circuits, 1971