High-Resolution Scanning Transmission Electron Microscopy
- 22 July 1983
- journal article
- research article
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 221 (4608), 325-330
- https://doi.org/10.1126/science.6867711
Abstract
The high-resolution scanning transmission electron microscope is being used in a growing number of laboratories. This article provides a general overview of the instrument and its capabilities.This publication has 12 references indexed in Scilit:
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