Technique for Calculating X-Ray Intensities in the Electron Probe Microanalyzer
- 1 July 1960
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 31 (7), 1297-1298
- https://doi.org/10.1063/1.1735822
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Electron Probe X-Ray MicroanalyzerReview of Scientific Instruments, 1957