X-ray diffraction characterization of defect behavior in nanocrystalline nickel during annealing
- 31 December 1995
- journal article
- Published by Elsevier in Nanostructured Materials
- Vol. 6 (5-8), 543-546
- https://doi.org/10.1016/0965-9773(95)00116-6
Abstract
No abstract availableKeywords
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