A combined ion probe/spark source analysis system
- 31 October 1974
- Vol. 24 (10), 511-517
- https://doi.org/10.1016/0042-207x(74)90018-9
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Spectral Interferences in Secondary Ion Mass SpectrometryApplied Spectroscopy, 1973
- Instrumental aspects of secondary ion mass spectrometry and secondary ion imaging mass spectrometryVacuum, 1972
- Secondary ion mass analysis, Technique for three-dimensional characterizationAnalytical Chemistry, 1972
- Accuracy of analysis by electrical detection in spark source mass spectrometryAnalytical Chemistry, 1971
- Analytic methods for the ion microprobe mass analyzer. Part II.International Journal of Mass Spectrometry and Ion Physics, 1970
- Untersuchungen zur Emission positiver Sekundärionen aus festen Targets. Die Brauchbarkeit der Ionenbeschuß-Ionenquelle in der MassenspektroskopieZeitschrift für Naturforschung A, 1967
- A theoretical assessment of the possibility of selected-area mass-spectrometric analysis using a focused ion beamBritish Journal of Applied Physics, 1965
- Collection and sputtering experiments with noble gas ionsNuclear Instruments and Methods, 1961