The effect of phosphorus incorporation on the dielectric constant and ionic conductivity of anodic tantalum oxide
- 1 September 1975
- journal article
- Published by Elsevier in Electrochimica Acta
- Vol. 20 (9), 663-667
- https://doi.org/10.1016/0013-4686(75)90064-x
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- A radiotracer study of the composition and properties of anodic oxide films on tantalum and niobiumElectrochimica Acta, 1965
- Steady-state kinetics of formation of anodic oxide films on tantalum in sulphuric acidProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1960
- The determination of the thickness, dielectric constant, and other properties of anodic oxide films on tantalum from the interference coloursProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1958