The Measurements of the Reflectivity Spectrum near the L2,3 Edge of p-Type Silicon at Room Temperature
- 1 November 1972
- journal article
- other
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 33 (5), 1494
- https://doi.org/10.1143/jpsj.33.1494
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Extreme Ultraviolet Transmission of Crystalline and Amorphous SiliconPhysical Review Letters, 1972
- Photoabsorption near theEdge of Silicon and AluminumPhysical Review B, 1970
- Optical Constants of Germanium in the Region of the M_4,5 Edge*Journal of the Optical Society of America, 1968