Dislocation emission from cracks-observations by x-ray topography in silicon
- 30 November 1986
- journal article
- Published by Elsevier in Scripta Metallurgica
- Vol. 20 (11), 1495-1500
- https://doi.org/10.1016/0036-9748(86)90382-0
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Velocities of screw and 60° dislocations in n- and p-type siliconPhysica Status Solidi (a), 1979
- X-ray topography study of cleavage surfaces of NaCl and LiF single crystalsJournal of Applied Crystallography, 1977
- Strain Field around Cleavage Crack Stopped Halfway in LiF Single CrystalJapanese Journal of Applied Physics, 1975
- Plastic Deformation of MgO Single Crystals during Cleavage FractureJapanese Journal of Applied Physics, 1972
- Damages Induced by Spark Discharges in LiF Single CrystalsJapanese Journal of Applied Physics, 1972
- Dislocation motion accompanying cleavage in zincActa Metallurgica, 1970
- APPLICATION OF X-RAY TOPOGRAPHY TO THE ANALYSIS OF THE DISLOCATION ARRANGEMENT IN DEFORMED COPPER SINGLE CRYSTALSCanadian Journal of Physics, 1967
- Plastic deformation patterns on cleavage surfaces of lithium fluoridePhilosophical Magazine, 1966
- ‘seeing’ dislocations in zincPhilosophical Magazine, 1964
- The projection topograph: a new method in X-ray diffraction microradiographyActa Crystallographica, 1959