Dislocations and substructure in large 0° Czochralski sapphire crystals
- 31 July 1969
- journal article
- Published by Elsevier in Materials Research Bulletin
- Vol. 4 (7), 403-412
- https://doi.org/10.1016/0025-5408(69)90083-x
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- The use of x-ray topography for the observation and characterization of gross imperfections in sapphire single crystalsMaterials Research Bulletin, 1967
- Perfection of Ruby Laser CrystalsJournal of Applied Physics, 1965
- New X-Ray Diffraction Microscopy Technique for the Study of Imperfections in Semiconductor CrystalsJournal of Applied Physics, 1965
- Single-Crystal Silicon on a Sapphire SubstrateJournal of Applied Physics, 1964
- Dislocation Structures in Single‐Crystal Al2O3Journal of the American Ceramic Society, 1964
- Surface Structure in Corundum: I, Etching of DislocationsJournal of the American Ceramic Society, 1960