Chemical Shifts of Silicon X‐ray Photoelectron Spectra by Polymerization Structures of Silicates
- 1 July 1998
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 81 (7), 1970-1972
- https://doi.org/10.1111/j.1151-2916.1998.tb02579.x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Characterization of Surface‐Oxidized Phase in Silicon Nitride and Silicon Oxynitride Powders by X‐ray Photoelectron SpectroscopyJournal of the American Ceramic Society, 1995
- Two-dimensional chemical state plots: a standardized data set for use in identifying chemical states by x-ray photoelectron spectroscopyAnalytical Chemistry, 1979
- Empirical bond-strength–bond-length curves for oxidesActa Crystallographica Section A, 1973