Margin degradation in the long-term testing of 3 µm bubble devices
- 1 September 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 13 (5), 1586-1591
- https://doi.org/10.1109/tmag.1977.1059661
Abstract
No abstract availableKeywords
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