Quenched-In Defects in CsCl-Type Alloys. I

Abstract

CsCl‐type Au‐Cd binary alloys and Au‐Cd‐Cu ternary alloys were quenched from various elevated temperatures to determine the activation energy for defect formation. Except at high temperatures, Arrhenius linearity was observed when the logarithm of the excess quenched‐in resistivity increment was plotted vs reciprocal temperature. The corresponding activation energies were ∼0.4 eV, considerably smaller than that expected theoretically. The effects of specimen size and possible quenching strains were also investigated.