Lattice Image Observation of Extended Dislocations in CdS by High Resolution Electron Microscopy
- 1 October 1982
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 21 (10A), L621-623
- https://doi.org/10.1143/jjap.21.l621
Abstract
Atomistic configurations of extended glide dislocations multiplied on the basal plane in CdS have been observed for the first time by high resolution electron microscopy. From the widths of the 60°-dislocation (∼9.0 nm) and the screw dislocations (∼3.6 nm), the energy of the intrinsic stacking fault has been estimated to be 13±2 mJ/m2.Keywords
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