Surface-bonding geometry of (2×1)S/Ge(001) by the normal-emission angle-resolved photoemission extended-fine-structure technique
- 15 October 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 38 (12), 8241-8248
- https://doi.org/10.1103/physrevb.38.8241
Abstract
The surface structure of (2×1)S/Ge(001) was determined using the angle-resolved photoemission extended-fine-structure technique in the normal-emission direction. By comparison of the experimental data with curved-wave, multiple-scattering calculations, quantitative information about the local adsorption geometry was obtained. In particular, adsorption in a twofold bridge site, with a S-Ge bond length of 2.36±0.05 Å, was found. The twofold S bridge appears most likely to occur between two partially intact symmetric Ge-Ge dimers, with the Ge dimer laterally displaced by 0.10±0.05 Å from the bulk position. This result therefore provides evidence for S bonding to strong dangling bonds in the original dimers of the clean Ge(001) surface. There is, however, no evidence of significant surface contraction or expansion in the substrate layers, in contrast to the (2×2)S/Ge(111) case.Keywords
This publication has 33 references indexed in Scilit:
- Surface structure of (22) S/Ge(111) determined by angle-resolved photoemission fine structurePhysical Review B, 1987
- Geometry of (22)S/Cu(001) determined with use of angle-resolved-photoemission extended fine structurePhysical Review B, 1987
- Angle-resolved-photoemission extended-fine-structure spectroscopy investigation of c(2×2) S/Ni(011)Physical Review B, 1987
- Hydrogen adsorption on Ge(100) studied by high-resolution energy-loss spectroscopyPhysical Review B, 1986
- Adsorbate-geometry determination by measurement and analysis of angle-resolved-photoemission extended-fine-structure data: Application toc(2×2)S/Ni(001)Physical Review B, 1986
- Direct determination of surface structures from photoelectron diffractionJournal of Vacuum Science & Technology A, 1984
- Direct Surface Structure Determination with Photoelectron DiffractionPhysical Review Letters, 1983
- Angle-resolved photoelectron spectroscopy investigation of intrinsic surface states on the Ge(001)-(2 × 1) reconstructed surfacePhysical Review B, 1983
- On the structure of reconstructed Si(001)2×1 and Ge(001)2×1 surfacesJournal of Physics C: Solid State Physics, 1979
- Diffraction of Photoelectrons Emitted from Core Levels of Te and Na Atoms Adsorbed on Ni(001)Physical Review Letters, 1978