Critical time of the lognormal distribution
- 11 February 1994
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 34 (2), 261-266
- https://doi.org/10.1016/0026-2714(94)90107-4
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- The Inverse Gaussian Distribution as a Lifetime ModelTechnometrics, 1977
- Invariance of Maximum Likelihood EstimatorsThe Annals of Mathematical Statistics, 1966