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Surface and thin-film analysis: Concepts, capabilities and limitations
Home
Publications
Surface and thin-film analysis: Concepts, capabilities and limitations
Surface and thin-film analysis: Concepts, capabilities and limitations
SH
S. Hofmann
S. Hofmann
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31 August 1979
journal article
Published by
Elsevier
in
Talanta
Vol. 26
(8)
,
665-673
https://doi.org/10.1016/0039-9140(79)80171-x
Abstract
No abstract available
Keywords
SURVEY
SCATTERING
AUGER
SECONDARY
ISS
SPECTROMETRY
ROUGHENING
ESCA
OUTLINED
ILLUSTRATE
Cited by 12 articles