Structure ofa-GeSe2from x-ray scattering measurements

Abstract

Grazing-incidence x-ray scattering techniques have been used to study very thin (≥250 Å) films of amorphous ${\mathrm{GeSe}}_2$. We find that the first sharp diffraction peak in these glasses arises from intrinsic features of chemically ordered tetrahedral bonding and not necessarily from a layered nature of the glass. We find no evidence of an oriented or layered structure and conclude that, if a layered structure is present, it must differ significantly from the crystalline phase.